TMC developed a unique approach to characterize high resistance thin films. A new electrical parameter, surface capacitance (Farad/sq), was derived to complement surface resistance (Ohms/sq) in characterization of conductive films’ transmission reflection magnitude and phase behaviors.

This presentation reviews the approach, assumptions, equation derivations, and shortcomings of the conventional conductive thin film analysis. Criteria which validate the conventional thin film equation will be examined and quantified. When thin film criteria are violated, surface resistance extractions using transmission and reflection data will result with very different results.  Thin film extraction using TMC’s surface resistance and surface capacitance equations will resolve this issue.

EM analysis and literature have long established coexistence of displacement and conduction currents in lossy conductors. Accounting for displacement current in lossy conductors completes magnitude and phase characterizations of conductive films.  This class will explain derivation and data extraction of surface resistance and surface capacitance.

Coax and waveguide measurements are generally considered as accurate and reliable techniques for permittivity and permeability characterizations due to their use of well-defined CAL kits and error correction algorithm. Key practice in sample preparation and test setup are reviewed to achieve comparable focus beam and coax test results. Focus beam setup specific errors will be examined so that 1) meaningful error bars may be applied to a broad range of test materials, and 2) long term system performances may also be monitored.

TMC takes a unique approach to permittivity and permeability iterative extractions.  Test results are analyzed with approximation models, which generate initial guesses for iterative calculations. This approach facilitates high index material extractions without wild initial guesses. Numerical issues that cause Nicolson-Ross extractions to fail are addressed to expand the method’s extraction range into Ka band.

This presentation will discuss a novel focus beam test configuration and data extraction method to improve measurement and extraction accuracy. This approach may also improve material characterizations at elevated temperatures.